TEST_NAME : Wafer
TEST_DATE : 24_10_10-18_36_42
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-010-026-13 | FUSED_ID : 6359364768416965037
  IC_TEMP :  -56.09 | VDDM : 1128.25 | AUX_INT :   -6.56 | CsaBias :   70.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.74125e-04 / 2
  ADC_P0  : -6.55976e-03 ± 2.11635e-02
  ADC_P1  : 8.58781e-03 ± 5.44075e-04
  ADC_P2  : -5.58322e-06 ± 2.76479e-06
  CSA_Chi2/NDF : 1.49723e-04 / 2
  CSA_P0  : 5.95545e-02 ± 8.16143e-03
  CSA_P1  : 1.00982e-02 ± 6.14905e-04
  CSA_P2  : -4.80315e-05 ± 9.36428e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [28]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [35, 65]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1168', '1.800', '0.1705', '1.799', '0.0788', '7.000', '0.7077', 1, 1, 1, 1, 1728578202.0321705]
VI_after__Init : ['1.201', '0.1168', '1.800', '0.1705', '1.800', '0.0741', '7.000', '0.7076', 1, 1, 1, 1, 1728578210.1464581]
VI_at__the_End : ['1.202', '0.5021', '1.800', '0.1412', '1.800', '0.1114', '7.000', '0.7082', 1, 1, 1, 1, 1728578269.8918037]