TEST_NAME : Wafer
TEST_DATE : 24_10_10-18_46_35
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-011-023-00 | FUSED_ID : 6359364768416969072
  IC_TEMP :  -56.34 | VDDM : 1116.75 | AUX_INT :   -6.25 | CsaBias :   82.77
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.64718e-04 / 2
  ADC_P0  : -6.24533e-03 ± 1.98676e-02
  ADC_P1  : 8.15675e-03 ± 4.71638e-04
  ADC_P2  : -5.88154e-06 ± 2.21201e-06
  CSA_Chi2/NDF : 9.11237e-05 / 2
  CSA_P0  : 5.82947e-02 ± 6.36705e-03
  CSA_P1  : 9.33290e-03 ± 4.79711e-04
  CSA_P2  : -3.91639e-05 ± 7.30543e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [6]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4253', '1.800', '0.1697', '1.799', '0.0952', '7.000', '0.7070', 1, 1, 1, 1, 1728578795.5179374]
VI_after__Init : ['1.202', '0.4259', '1.800', '0.1700', '1.800', '0.0897', '7.000', '0.7070', 1, 1, 1, 1, 1728578803.72935]
VI_at__the_End : ['1.202', '0.4875', '1.800', '0.1380', '1.802', '0.1143', '7.000', '0.7076', 1, 1, 1, 1, 1728578866.0656686]