TEST_NAME : Wafer
TEST_DATE : 24_10_10-18_43_17
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-011-025-00 | FUSED_ID : 6359364768416969104
  IC_TEMP :  -56.05 | VDDM : 1114.28 | AUX_INT :   -7.44 | CsaBias :   75.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.89811e-04 / 2
  ADC_P0  : -7.43886e-03 ± 2.13015e-02
  ADC_P1  : 8.33466e-03 ± 5.22170e-04
  ADC_P2  : -5.71045e-06 ± 2.53460e-06
  CSA_Chi2/NDF : 1.33118e-04 / 2
  CSA_P0  : 5.90573e-02 ± 7.69557e-03
  CSA_P1  : 9.99189e-03 ± 5.79806e-04
  CSA_P2  : -4.64316e-05 ± 8.82975e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [86]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [1, 35]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4873', '1.800', '0.1413', '1.800', '0.0968', '7.000', '0.7071', 1, 1, 1, 1, 1728578597.177286]
VI_after__Init : ['1.202', '0.4877', '1.799', '0.1415', '1.799', '0.0919', '7.000', '0.7072', 1, 1, 1, 1, 1728578605.2686918]
VI_at__the_End : ['1.202', '0.4996', '1.800', '0.1386', '1.800', '0.1119', '7.000', '0.7079', 1, 1, 1, 1, 1728578670.8520253]