TEST_NAME : Wafer
TEST_DATE : 24_10_10-18_41_38
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-011-026-00 | FUSED_ID : 6359364768416969120
  IC_TEMP :  -53.05 | VDDM : 1125.88 | AUX_INT :   -8.02 | CsaBias :   94.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33273e-03 / 2
  ADC_P0  : -8.02383e-03 ± 2.47823e-02
  ADC_P1  : 7.92328e-03 ± 5.84822e-04
  ADC_P2  : -4.72559e-06 ± 2.73689e-06
  CSA_Chi2/NDF : 8.63641e-05 / 2
  CSA_P0  : 5.61076e-02 ± 6.19853e-03
  CSA_P1  : 9.25390e-03 ± 4.67015e-04
  CSA_P2  : -3.62118e-05 ± 7.11208e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [20]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2884', '1.800', '0.1523', '1.800', '0.0900', '7.000', '0.7081', 1, 1, 1, 1, 1728578497.6204376]
VI_after__Init : ['1.201', '0.2884', '1.800', '0.1523', '1.800', '0.0845', '7.000', '0.7072', 1, 1, 1, 1, 1728578506.4626184]
VI_at__the_End : ['1.202', '0.4929', '1.800', '0.1358', '1.800', '0.1107', '7.000', '0.7077', 1, 1, 1, 1, 1728578571.44204]