TEST_NAME : Wafer
TEST_DATE : 24_10_10-19_32_38
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-012-008-15 | FUSED_ID : 6359364768416972943
  IC_TEMP :  -62.52 | VDDM : 1126.26 | AUX_INT :   -7.97 | CsaBias :   73.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13385e-03 / 2
  ADC_P0  : -7.97304e-03 ± 2.28320e-02
  ADC_P1  : 8.20558e-03 ± 5.54964e-04
  ADC_P2  : -5.17817e-06 ± 2.67967e-06
  CSA_Chi2/NDF : 1.52997e-04 / 2
  CSA_P0  : 5.95258e-02 ± 8.25020e-03
  CSA_P1  : 1.00796e-02 ± 6.21593e-04
  CSA_P2  : -5.16727e-05 ± 9.46612e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [14, 61, 81, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2190', '1.800', '0.1400', '1.800', '0.0896', '7.000', '0.7084', 1, 1, 1, 1, 1728581557.7686923]
VI_after__Init : ['1.202', '0.2191', '1.800', '0.1400', '1.799', '0.0824', '7.000', '0.7077', 1, 1, 1, 1, 1728581566.425069]
VI_at__the_End : ['1.201', '0.4850', '1.800', '0.1414', '1.803', '0.1143', '7.000', '0.7090', 1, 1, 1, 1, 1728581628.2675445]