TEST_NAME : Wafer
TEST_DATE : 24_10_10-19_39_11
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-012-012-15 | FUSED_ID : 6359364768416973007
  IC_TEMP :  -48.91 | VDDM : 1136.53 | AUX_INT : -110.17 | CsaBias :   11.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.09380e-04 / 2
  ADC_P0  : -1.10171e-01 ± 2.48981e-02
  ADC_P1  : 9.50742e-03 ± 5.67179e-04
  ADC_P2  : -1.02336e-05 ± 2.53077e-06
  CSA_Chi2/NDF : 7.76362e-05 / 2
  CSA_P0  : 6.02215e-02 ± 5.87698e-03
  CSA_P1  : 9.53375e-03 ± 4.42788e-04
  CSA_P2  : -3.89082e-05 ± 6.74314e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [10]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [76]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2173', '1.800', '0.1592', '1.800', '0.0819', '7.000', '0.7079', 1, 1, 1, 1, 1728581951.695835]
VI_after__Init : ['1.202', '0.2173', '1.800', '0.1592', '1.799', '0.0765', '7.000', '0.7080', 1, 1, 1, 1, 1728581959.7503457]
VI_at__the_End : ['1.202', '0.5040', '1.800', '0.1400', '1.806', '0.1090', '7.000', '0.7086', 1, 1, 1, 1, 1728582026.2672555]