TEST_NAME : Wafer
TEST_DATE : 24_10_10-19_40_50
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-012-013-15 | FUSED_ID : 6359364768416973023
  IC_TEMP :  -53.77 | VDDM : 1135.93 | AUX_INT : -122.82 | CsaBias :   10.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.89049e-04 / 2
  ADC_P0  : -1.22815e-01 ± 2.63267e-02
  ADC_P1  : 9.65907e-03 ± 5.86746e-04
  ADC_P2  : -1.09585e-05 ± 2.57517e-06
  CSA_Chi2/NDF : 7.36468e-05 / 2
  CSA_P0  : 5.84340e-02 ± 5.72399e-03
  CSA_P1  : 9.21831e-03 ± 4.31262e-04
  CSA_P2  : -3.58906e-05 ± 6.56760e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [20, 32, 67, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2156', '1.800', '0.1510', '1.800', '0.0808', '7.000', '0.7078', 1, 1, 1, 1, 1728582050.5633986]
VI_after__Init : ['1.202', '0.2156', '1.800', '0.1510', '1.800', '0.0756', '7.000', '0.7079', 1, 1, 1, 1, 1728582058.6608365]
VI_at__the_End : ['1.201', '0.4938', '1.800', '0.1349', '1.799', '0.1100', '7.000', '0.7086', 1, 1, 1, 1, 1728582126.00466]