TEST_NAME : Wafer
TEST_DATE : 24_10_10-20_08_51
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-013-024-05 | FUSED_ID : 6359364768416977285
  IC_TEMP :  -57.07 | VDDM : 1133.44 | AUX_INT :   -9.45 | CsaBias :   79.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52749e-03 / 2
  ADC_P0  : -9.45125e-03 ± 2.64834e-02
  ADC_P1  : 8.18816e-03 ± 6.27667e-04
  ADC_P2  : -5.78715e-06 ± 2.95505e-06
  CSA_Chi2/NDF : 1.00207e-04 / 2
  CSA_P0  : 5.79442e-02 ± 6.67684e-03
  CSA_P1  : 9.71740e-03 ± 5.03052e-04
  CSA_P2  : -4.27628e-05 ± 7.66088e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [0, 30, 36, 42, 90]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [51, 68, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3334', '1.800', '0.1631', '1.800', '0.0945', '7.000', '0.7088', 1, 1, 1, 1, 1728583731.3862484]
VI_after__Init : ['1.201', '0.3334', '1.800', '0.1631', '1.800', '0.0873', '7.000', '0.7080', 1, 1, 1, 1, 1728583739.3796644]
VI_at__the_End : ['1.201', '0.4988', '1.800', '0.1366', '1.801', '0.1139', '7.000', '0.7086', 1, 1, 1, 1, 1728583804.5026984]