TEST_NAME : Wafer
TEST_DATE : 24_10_10-21_59_00
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-015-004-01 | FUSED_ID : 6359364768416985153
  IC_TEMP :  -63.16 | VDDM : 1117.86 | AUX_INT :   -8.85 | CsaBias :   78.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26204e-03 / 2
  ADC_P0  : -8.84529e-03 ± 2.40053e-02
  ADC_P1  : 8.78960e-03 ± 6.01565e-04
  ADC_P2  : -7.34558e-06 ± 2.98163e-06
  CSA_Chi2/NDF : 1.43805e-04 / 2
  CSA_P0  : 5.80622e-02 ± 7.99853e-03
  CSA_P1  : 9.82779e-03 ± 6.02631e-04
  CSA_P2  : -4.66079e-05 ± 9.17736e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [74]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1799', '1.800', '0.1815', '1.799', '0.0821', '7.000', '0.7082', 1, 1, 1, 1, 1728590340.5458524]
VI_after__Init : ['1.202', '0.1797', '1.800', '0.1814', '1.800', '0.0766', '7.000', '0.7077', 1, 1, 1, 1, 1728590348.5891716]
VI_at__the_End : ['1.202', '0.4894', '1.799', '0.1380', '1.801', '0.1126', '7.000', '0.7089', 1, 1, 1, 1, 1728590417.4378152]