TEST_NAME : Wafer
TEST_DATE : 24_10_10-21_50_46
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-015-009-01 | FUSED_ID : 6359364768416985233
  IC_TEMP :  -50.82 | VDDM : 1117.82 | AUX_INT :   -7.64 | CsaBias :   95.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14750e-03 / 2
  ADC_P0  : -7.63922e-03 ± 2.29709e-02
  ADC_P1  : 8.02995e-03 ± 5.48303e-04
  ADC_P2  : -4.96072e-06 ± 2.59313e-06
  CSA_Chi2/NDF : 9.60303e-05 / 2
  CSA_P0  : 5.93358e-02 ± 6.53622e-03
  CSA_P1  : 9.62980e-03 ± 4.92457e-04
  CSA_P2  : -4.09264e-05 ± 7.49953e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [38]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1156', '1.800', '0.1306', '1.799', '0.0836', '7.000', '0.7076', 1, 1, 1, 1, 1728589846.1082456]
VI_after__Init : ['1.202', '0.1156', '1.800', '0.1305', '1.801', '0.0784', '7.000', '0.7079', 1, 1, 1, 1, 1728589854.9555268]
VI_at__the_End : ['1.202', '0.4999', '1.800', '0.1379', '1.799', '0.1107', '7.000', '0.7085', 1, 1, 1, 1, 1728589923.8552222]