TEST_NAME : Wafer
TEST_DATE : 24_10_10-21_47_29
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-015-011-01 | FUSED_ID : 6359364768416985265
  IC_TEMP :  -59.07 | VDDM : 1129.92 | AUX_INT :  -94.89 | CsaBias :   19.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34787e-03 / 2
  ADC_P0  : -9.48938e-02 ± 2.93344e-02
  ADC_P1  : 9.63799e-03 ± 6.90594e-04
  ADC_P2  : -1.03949e-05 ± 3.19604e-06
  CSA_Chi2/NDF : 1.21748e-04 / 2
  CSA_P0  : 5.68278e-02 ± 7.35957e-03
  CSA_P1  : 9.62572e-03 ± 5.54490e-04
  CSA_P2  : -4.27020e-05 ± 8.44423e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [57]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [59]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1180', '1.800', '0.1408', '1.799', '0.0860', '7.000', '0.7084', 1, 1, 1, 1, 1728589648.7525816]
VI_after__Init : ['1.201', '0.1180', '1.800', '0.1409', '1.800', '0.0798', '7.000', '0.7077', 1, 1, 1, 1, 1728589656.8208468]
VI_at__the_End : ['1.202', '0.4901', '1.800', '0.1392', '1.803', '0.1118', '7.000', '0.7083', 1, 1, 1, 1, 1728589717.59818]