TEST_NAME : Wafer
TEST_DATE : 24_10_10-21_29_22
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-015-022-06 | FUSED_ID : 6359364768416985446
  IC_TEMP :  -54.93 | VDDM : 1126.35 | AUX_INT :   -9.32 | CsaBias :   87.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35195e-03 / 2
  ADC_P0  : -9.31517e-03 ± 2.48789e-02
  ADC_P1  : 8.16361e-03 ± 5.84627e-04
  ADC_P2  : -5.92408e-06 ± 2.72779e-06
  CSA_Chi2/NDF : 9.14517e-05 / 2
  CSA_P0  : 5.92183e-02 ± 6.37849e-03
  CSA_P1  : 9.69133e-03 ± 4.80573e-04
  CSA_P2  : -4.08993e-05 ± 7.31857e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [79]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3023', '1.800', '0.1252', '1.800', '0.0890', '7.000', '0.7076', 1, 1, 1, 1, 1728588562.76204]
VI_after__Init : ['1.202', '0.3023', '1.799', '0.1252', '1.799', '0.0835', '7.000', '0.7076', 1, 1, 1, 1, 1728588570.791519]
VI_at__the_End : ['1.202', '0.5041', '1.800', '0.1393', '1.804', '0.1121', '7.000', '0.7082', 1, 1, 1, 1, 1728588631.1187198]