TEST_NAME : Wafer
TEST_DATE : 24_10_10-21_26_13
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-015-024-06 | FUSED_ID : 6359364768416985478
  IC_TEMP :  -54.44 | VDDM : 1132.26 | AUX_INT :  -17.23 | CsaBias :   93.93
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30131e-03 / 2
  ADC_P0  : -1.72278e-02 ± 2.48166e-02
  ADC_P1  : 8.01972e-03 ± 5.67247e-04
  ADC_P2  : -5.70441e-06 ± 2.57373e-06
  CSA_Chi2/NDF : 9.51887e-05 / 2
  CSA_P0  : 5.86856e-02 ± 6.50751e-03
  CSA_P1  : 9.27025e-03 ± 4.90294e-04
  CSA_P2  : -3.48071e-05 ± 7.46660e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3593', '1.800', '0.1500', '1.799', '0.0894', '7.000', '0.7077', 1, 1, 1, 1, 1728588373.0908496]
VI_after__Init : ['1.201', '0.3593', '1.800', '0.1500', '1.800', '0.0843', '7.000', '0.7075', 1, 1, 1, 1, 1728588381.9251032]
VI_at__the_End : ['1.202', '0.5038', '1.800', '0.1352', '1.801', '0.1106', '7.000', '0.7082', 1, 1, 1, 1, 1728588448.7309523]