TEST_NAME : Wafer
TEST_DATE : 24_10_10-22_07_13
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-016-010-09 | FUSED_ID : 6359364768416989353
  IC_TEMP :  -50.80 | VDDM : 1131.12 | AUX_INT :   -7.78 | CsaBias :   94.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13414e-03 / 2
  ADC_P0  : -7.77738e-03 ± 2.28288e-02
  ADC_P1  : 7.89627e-03 ± 5.34216e-04
  ADC_P2  : -4.86367e-06 ± 2.47798e-06
  CSA_Chi2/NDF : 7.50833e-05 / 2
  CSA_P0  : 5.71803e-02 ± 5.77955e-03
  CSA_P1  : 9.41332e-03 ± 4.35447e-04
  CSA_P2  : -3.71534e-05 ± 6.63135e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [58]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [8]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4225', '1.800', '0.1126', '1.799', '0.0884', '7.000', '0.7079', 1, 1, 1, 1, 1728590832.8749883]
VI_after__Init : ['1.202', '0.4225', '1.800', '0.1126', '1.799', '0.0831', '7.000', '0.7079', 1, 1, 1, 1, 1728590841.003341]
VI_at__the_End : ['1.202', '0.4991', '1.800', '0.1353', '1.803', '0.1079', '7.000', '0.7086', 1, 1, 1, 1, 1728590905.7998629]