TEST_NAME : Wafer
TEST_DATE : 24_10_10-22_10_30
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-016-012-09 | FUSED_ID : 6359364768416989385
  IC_TEMP :  -53.69 | VDDM : 1121.57 | AUX_INT :   -9.67 | CsaBias :   86.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52650e-03 / 2
  ADC_P0  : -9.67470e-03 ± 2.64660e-02
  ADC_P1  : 8.05395e-03 ± 6.15010e-04
  ADC_P2  : -5.65953e-06 ± 2.84000e-06
  CSA_Chi2/NDF : 9.22816e-05 / 2
  CSA_P0  : 6.01570e-02 ± 6.40737e-03
  CSA_P1  : 9.10717e-03 ± 4.82749e-04
  CSA_P2  : -3.59626e-05 ± 7.35170e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [50]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1807', '1.800', '0.1123', '1.799', '0.0908', '7.000', '0.7079', 1, 1, 1, 1, 1728591029.9680233]
VI_after__Init : ['1.202', '0.1808', '1.800', '0.1123', '1.800', '0.0856', '7.000', '0.7081', 1, 1, 1, 1, 1728591037.9714844]
VI_at__the_End : ['1.202', '0.4899', '1.800', '0.1368', '1.801', '0.1129', '7.000', '0.7088', 1, 1, 1, 1, 1728591098.350052]