TEST_NAME : Wafer
TEST_DATE : 24_10_10-22_17_05
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-016-016-14 | FUSED_ID : 6359364768416989454
  IC_TEMP :  -54.32 | VDDM : 1120.77 | AUX_INT :   -6.42 | CsaBias :   89.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04234e-03 / 2
  ADC_P0  : -6.42336e-03 ± 2.18320e-02
  ADC_P1  : 8.05525e-03 ± 5.10875e-04
  ADC_P2  : -5.82998e-06 ± 2.35861e-06
  CSA_Chi2/NDF : 7.66369e-05 / 2
  CSA_P0  : 5.91407e-02 ± 5.83904e-03
  CSA_P1  : 9.27056e-03 ± 4.39929e-04
  CSA_P2  : -3.55253e-05 ± 6.69960e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [15, 43]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [31]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1660', '1.800', '0.1607', '1.800', '0.0788', '7.000', '0.7080', 1, 1, 1, 1, 1728591425.7611]
VI_after__Init : ['1.201', '0.1660', '1.800', '0.1606', '1.800', '0.0745', '7.000', '0.7081', 1, 1, 1, 1, 1728591433.8774574]
VI_at__the_End : ['1.201', '0.4991', '1.800', '0.1394', '1.803', '0.1073', '7.000', '0.7086', 1, 1, 1, 1, 1728591493.334104]