TEST_NAME : Wafer
TEST_DATE : 24_10_10-22_18_45
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-016-017-14 | FUSED_ID : 6359364768416989470
  IC_TEMP :  -48.69 | VDDM : 1133.68 | AUX_INT :   -6.48 | CsaBias :   90.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.25902e-04 / 2
  ADC_P0  : -6.48087e-03 ± 1.94252e-02
  ADC_P1  : 8.14180e-03 ± 4.62115e-04
  ADC_P2  : -5.85821e-06 ± 2.16541e-06
  CSA_Chi2/NDF : 4.18321e-05 / 2
  CSA_P0  : 6.10705e-02 ± 4.31397e-03
  CSA_P1  : 8.95092e-03 ± 3.25026e-04
  CSA_P2  : -3.14244e-05 ± 4.94977e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [15, 84, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3910', '1.800', '0.1258', '1.799', '0.0920', '7.000', '0.7086', 1, 1, 1, 1, 1728591524.7096887]
VI_after__Init : ['1.201', '0.3910', '1.800', '0.1258', '1.801', '0.0851', '7.000', '0.7080', 1, 1, 1, 1, 1728591532.8701315]
VI_at__the_End : ['1.202', '0.4995', '1.800', '0.1360', '1.799', '0.1083', '7.000', '0.7088', 1, 1, 1, 1, 1728591594.3355715]