TEST_NAME : Wafer
TEST_DATE : 24_10_10-22_48_24
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-017-011-04 | FUSED_ID : 6359364768416993460
  IC_TEMP :  -53.59 | VDDM : 1122.30 | AUX_INT :   -8.69 | CsaBias :   80.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.40127e-03 / 2
  ADC_P0  : -8.68503e-03 ± 2.53841e-02
  ADC_P1  : 8.14922e-03 ± 6.04759e-04
  ADC_P2  : -5.50038e-06 ± 2.86015e-06
  CSA_Chi2/NDF : 9.86975e-05 / 2
  CSA_P0  : 5.75177e-02 ± 6.62637e-03
  CSA_P1  : 9.35304e-03 ± 4.99249e-04
  CSA_P2  : -3.85703e-05 ± 7.60297e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [50, 78]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [27]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0524', '1.799', '0.1774', '1.800', '0.0799', '7.000', '0.7080', 1, 1, 1, 1, 1728593303.7591262]
VI_after__Init : ['1.202', '0.0524', '1.800', '0.1774', '1.801', '0.0750', '7.000', '0.7082', 1, 1, 1, 1, 1728593311.889576]
VI_at__the_End : ['1.201', '0.4902', '1.808', '0.1373', '1.805', '0.1129', '7.000', '0.7090', 1, 1, 1, 1, 1728593379.9585662]