TEST_NAME : Wafer
TEST_DATE : 24_10_10-22_46_44
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-017-012-04 | FUSED_ID : 6359364768416993476
  IC_TEMP :  -53.18 | VDDM : 1130.00 | AUX_INT :   -7.21 | CsaBias :   88.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19642e-03 / 2
  ADC_P0  : -7.20527e-03 ± 2.34417e-02
  ADC_P1  : 8.06521e-03 ± 5.56025e-04
  ADC_P2  : -5.49179e-06 ± 2.60131e-06
  CSA_Chi2/NDF : 8.15188e-05 / 2
  CSA_P0  : 5.79905e-02 ± 6.02215e-03
  CSA_P1  : 9.50666e-03 ± 4.53725e-04
  CSA_P2  : -3.85292e-05 ± 6.90970e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [104, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [14]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1387', '1.800', '0.1692', '1.799', '0.0819', '7.000', '0.7080', 1, 1, 1, 1, 1728593204.7682643]
VI_after__Init : ['1.202', '0.1387', '1.800', '0.1691', '1.802', '0.0768', '7.000', '0.7079', 1, 1, 1, 1, 1728593212.8408084]
VI_at__the_End : ['1.202', '0.5023', '1.800', '0.1390', '1.799', '0.1093', '7.000', '0.7090', 1, 1, 1, 1, 1728593272.5854049]