TEST_NAME : Wafer
TEST_DATE : 24_10_10-22_58_17
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-018-010-10 | FUSED_ID : 6359364768416997546
  IC_TEMP :  -52.99 | VDDM : 1125.10 | AUX_INT :   -7.79 | CsaBias :   80.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36299e-03 / 2
  ADC_P0  : -7.78877e-03 ± 2.50714e-02
  ADC_P1  : 8.05343e-03 ± 6.03579e-04
  ADC_P2  : -4.80292e-06 ± 2.88047e-06
  CSA_Chi2/NDF : 9.49006e-05 / 2
  CSA_P0  : 5.59902e-02 ± 6.49766e-03
  CSA_P1  : 9.57765e-03 ± 4.89552e-04
  CSA_P2  : -3.98513e-05 ± 7.45529e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [79, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1679', '1.800', '0.1547', '1.800', '0.0795', '7.000', '0.7081', 1, 1, 1, 1, 1728593896.77427]
VI_after__Init : ['1.202', '0.1679', '1.800', '0.1546', '1.800', '0.0739', '7.000', '0.7080', 1, 1, 1, 1, 1728593904.767715]
VI_at__the_End : ['1.202', '0.4979', '1.800', '0.1350', '1.799', '0.1111', '7.000', '0.7088', 1, 1, 1, 1, 1728593972.787496]