TEST_NAME : Wafer
TEST_DATE : 24_10_11-13_03_23
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-002-010-14 | FUSED_ID : 6359364768417980590
  IC_TEMP : -110.77 | VDDM : 1106.37 | AUX_INT :  -13.34 | CsaBias :   33.83
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.57209e-03 / 2
  ADC_P0  : -1.33426e-02 ± 3.43671e-02
  ADC_P1  : 9.47713e-03 ± 9.10860e-04
  ADC_P2  : -8.36610e-06 ± 4.84481e-06
  CSA_Chi2/NDF : 1.47715e-04 / 2
  CSA_P0  : 5.62823e-02 ± 8.10652e-03
  CSA_P1  : 1.01607e-02 ± 6.10768e-04
  CSA_P2  : -7.22455e-05 ± 9.30127e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [27]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2734', '1.800', '0.1418', '1.800', '0.0950', '7.000', '0.7090', 1, 1, 1, 1, 1728644603.4462252]
VI_after__Init : ['1.202', '0.2764', '1.799', '0.1423', '1.799', '0.0886', '7.000', '0.7081', 1, 1, 1, 1, 1728644611.6236217]
VI_at__the_End : ['1.198', '0.4075', '1.800', '0.1322', '1.800', '0.1295', '7.000', '0.7089', 1, 1, 1, 1, 1728644675.530744]