TEST_NAME : Wafer
TEST_DATE : 24_10_11-13_14_47
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-002-017-09 | FUSED_ID : 6359364768417980697
  IC_TEMP : -100.70 | VDDM : 1119.86 | AUX_INT :  -10.66 | CsaBias :   63.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.90413e-03 / 2
  ADC_P0  : -1.06609e-02 ± 2.95639e-02
  ADC_P1  : 9.30845e-03 ± 7.81890e-04
  ADC_P2  : -8.08915e-06 ± 4.10622e-06
  CSA_Chi2/NDF : 1.71545e-04 / 2
  CSA_P0  : 5.86750e-02 ± 8.73597e-03
  CSA_P1  : 1.01481e-02 ± 6.58192e-04
  CSA_P2  : -6.74456e-05 ± 1.00235e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [62, 77, 96, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [4, 31, 50, 60, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1955', '1.800', '0.1202', '1.800', '0.0996', '7.000', '0.7078', 1, 1, 1, 1, 1728645287.394507]
VI_after__Init : ['1.202', '0.1957', '1.800', '0.1204', '1.800', '0.0938', '7.000', '0.7078', 1, 1, 1, 1, 1728645295.4759903]
VI_at__the_End : ['1.202', '0.4269', '1.800', '0.1314', '1.800', '0.1296', '7.000', '0.7085', 1, 1, 1, 1, 1728645364.3508027]