TEST_NAME : Wafer
TEST_DATE : 24_10_11-13_34_24
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-003-013-03 | FUSED_ID : 6359364768417984723
  IC_TEMP :  -90.54 | VDDM : 1112.62 | AUX_INT :  -10.87 | CsaBias :   61.78
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.05026e-03 / 2
  ADC_P0  : -1.08673e-02 ± 3.06617e-02
  ADC_P1  : 9.14252e-03 ± 7.93957e-04
  ADC_P2  : -7.62514e-06 ± 4.10821e-06
  CSA_Chi2/NDF : 1.58834e-04 / 2
  CSA_P0  : 5.46207e-02 ± 8.40609e-03
  CSA_P1  : 1.06562e-02 ± 6.33338e-04
  CSA_P2  : -7.17521e-05 ± 9.64499e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [9, 23, 24, 59, 69, 75, 100, 109, 110, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [30, 33, 42, 51, 81, 104, 114, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2561', '1.800', '0.1476', '1.800', '0.0958', '7.000', '0.7081', 1, 1, 1, 1, 1728646464.5867887]
VI_after__Init : ['1.202', '0.2551', '1.800', '0.1484', '1.800', '0.0888', '7.000', '0.7072', 1, 1, 1, 1, 1728646472.6401129]
VI_at__the_End : ['1.202', '0.4372', '1.800', '0.1312', '1.800', '0.1280', '7.000', '0.7083', 1, 1, 1, 1, 1728646540.213318]