TEST_NAME : Wafer
TEST_DATE : 24_10_11-13_32_45
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-003-014-03 | FUSED_ID : 6359364768417984739
  IC_TEMP :  -84.31 | VDDM : 1114.97 | AUX_INT :   -9.74 | CsaBias :   76.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58481e-03 / 2
  ADC_P0  : -9.73788e-03 ± 2.69925e-02
  ADC_P1  : 8.68366e-03 ± 6.78823e-04
  ADC_P2  : -6.39366e-06 ± 3.39785e-06
  CSA_Chi2/NDF : 2.13567e-04 / 2
  CSA_P0  : 5.57665e-02 ± 9.74741e-03
  CSA_P1  : 1.01326e-02 ± 7.34397e-04
  CSA_P2  : -6.16192e-05 ± 1.11840e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [12]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2223', '1.800', '0.1628', '1.800', '0.1003', '7.000', '0.7082', 1, 1, 1, 1, 1728646365.337302]
VI_after__Init : ['1.202', '0.2226', '1.800', '0.1631', '1.800', '0.0934', '7.000', '0.7072', 1, 1, 1, 1, 1728646373.416571]
VI_at__the_End : ['1.202', '0.4447', '1.800', '0.1340', '1.800', '0.1264', '7.000', '0.7078', 1, 1, 1, 1, 1728646433.2913816]