TEST_NAME : Wafer
TEST_DATE : 24_10_11-13_26_19
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-003-018-04 | FUSED_ID : 6359364768417984804
  IC_TEMP :  -89.57 | VDDM : 1118.13 | AUX_INT :  -11.11 | CsaBias :   61.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.76253e-03 / 2
  ADC_P0  : -1.11110e-02 ± 2.83643e-02
  ADC_P1  : 9.14222e-03 ± 7.22904e-04
  ADC_P2  : -8.37900e-06 ± 3.66079e-06
  CSA_Chi2/NDF : 2.59497e-04 / 2
  CSA_P0  : 5.78414e-02 ± 1.07446e-02
  CSA_P1  : 1.04803e-02 ± 8.09525e-04
  CSA_P2  : -6.80085e-05 ± 1.23281e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [74]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [25, 31, 75, 96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3612', '1.800', '0.1295', '1.800', '0.0986', '7.000', '0.7069', 1, 1, 1, 1, 1728645979.1273403]
VI_after__Init : ['1.202', '0.3625', '1.800', '0.1307', '1.800', '0.0938', '7.000', '0.7072', 1, 1, 1, 1, 1728645987.879634]
VI_at__the_End : ['1.202', '0.4486', '1.800', '0.1328', '1.800', '0.1277', '7.000', '0.7083', 1, 1, 1, 1, 1728646052.766704]