TEST_NAME : Wafer
TEST_DATE : 24_10_11-13_21_23
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-003-021-04 | FUSED_ID : 6359364768417984852
  IC_TEMP :  -92.34 | VDDM : 1122.75 | AUX_INT :  -10.09 | CsaBias :   53.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.59014e-03 / 2
  ADC_P0  : -1.00874e-02 ± 2.69542e-02
  ADC_P1  : 9.10673e-03 ± 6.88653e-04
  ADC_P2  : -8.28518e-06 ± 3.48455e-06
  CSA_Chi2/NDF : 2.07029e-04 / 2
  CSA_P0  : 5.83787e-02 ± 9.59705e-03
  CSA_P1  : 1.03667e-02 ± 7.23068e-04
  CSA_P2  : -6.46630e-05 ± 1.10115e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [38]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3015', '1.800', '0.1803', '1.800', '0.1051', '7.000', '0.7076', 1, 1, 1, 1, 1728645682.5586913]
VI_after__Init : ['1.202', '0.3022', '1.800', '0.1815', '1.800', '0.0996', '7.000', '0.7077', 1, 1, 1, 1, 1728645691.3480382]
VI_at__the_End : ['1.202', '0.4510', '1.800', '0.1373', '1.800', '0.1286', '7.000', '0.7081', 1, 1, 1, 1, 1728645750.4635656]