TEST_NAME : Wafer
TEST_DATE : 24_10_11-13_19_44
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-003-022-04 | FUSED_ID : 6359364768417984868
  IC_TEMP :  -90.44 | VDDM : 1121.12 | AUX_INT :  -10.22 | CsaBias :   62.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.91393e-03 / 2
  ADC_P0  : -1.02205e-02 ± 2.96484e-02
  ADC_P1  : 9.08640e-03 ± 7.72174e-04
  ADC_P2  : -7.18118e-06 ± 4.01592e-06
  CSA_Chi2/NDF : 1.28271e-04 / 2
  CSA_P0  : 5.69634e-02 ± 7.55418e-03
  CSA_P1  : 1.00664e-02 ± 5.69153e-04
  CSA_P2  : -6.16813e-05 ± 8.66753e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1859', '1.800', '0.1558', '1.800', '0.0898', '7.000', '0.7075', 1, 1, 1, 1, 1728645583.9361384]
VI_after__Init : ['1.202', '0.1860', '1.800', '0.1559', '1.800', '0.0852', '7.000', '0.7077', 1, 1, 1, 1, 1728645592.039515]
VI_at__the_End : ['1.202', '0.4408', '1.800', '0.1313', '1.800', '0.1264', '7.000', '0.7086', 1, 1, 1, 1, 1728645652.6998968]