TEST_NAME : Wafer
TEST_DATE : 24_10_11-13_45_57
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-004-006-11 | FUSED_ID : 6359364768417988715
  IC_TEMP :  -89.76 | VDDM : 1111.57 | AUX_INT :   -9.65 | CsaBias :   42.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.80551e-03 / 2
  ADC_P0  : -9.65210e-03 ± 2.87481e-02
  ADC_P1  : 8.78830e-03 ± 7.10564e-04
  ADC_P2  : -7.59386e-06 ± 3.48299e-06
  CSA_Chi2/NDF : 2.19378e-04 / 2
  CSA_P0  : 5.91190e-02 ± 9.87913e-03
  CSA_P1  : 9.85156e-03 ± 7.44321e-04
  CSA_P2  : -5.75127e-05 ± 1.13351e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2162', '1.800', '0.1589', '1.800', '0.0960', '7.000', '0.7075', 1, 1, 1, 1, 1728647156.5330584]
VI_after__Init : ['1.202', '0.2166', '1.800', '0.1591', '1.800', '0.0916', '7.000', '0.7075', 1, 1, 1, 1, 1728647164.8304012]
VI_at__the_End : ['1.202', '0.4475', '1.800', '0.1363', '1.800', '0.1262', '7.000', '0.7084', 1, 1, 1, 1, 1728647233.0319602]