TEST_NAME : Wafer
TEST_DATE : 24_10_11-13_47_35
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-004-007-11 | FUSED_ID : 6359364768417988731
  IC_TEMP :  -76.60 | VDDM : 1120.77 | AUX_INT :   -9.53 | CsaBias :   66.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.69944e-03 / 2
  ADC_P0  : -9.53075e-03 ± 2.79204e-02
  ADC_P1  : 8.56034e-03 ± 6.83898e-04
  ADC_P2  : -6.53976e-06 ± 3.33770e-06
  CSA_Chi2/NDF : 1.85853e-04 / 2
  CSA_P0  : 5.78118e-02 ± 9.09299e-03
  CSA_P1  : 1.04692e-02 ± 6.85091e-04
  CSA_P2  : -6.15601e-05 ± 1.04331e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [32, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [67, 81]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1457', '1.800', '0.1583', '1.800', '0.0918', '7.000', '0.7084', 1, 1, 1, 1, 1728647255.4680963]
VI_after__Init : ['1.202', '0.1457', '1.800', '0.1584', '1.800', '0.0849', '7.000', '0.7074', 1, 1, 1, 1, 1728647263.485415]
VI_at__the_End : ['1.202', '0.4685', '1.800', '0.1338', '1.800', '0.1243', '7.000', '0.7085', 1, 1, 1, 1, 1728647331.532041]