TEST_NAME : Wafer
TEST_DATE : 24_10_11-13_55_51
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-004-012-11 | FUSED_ID : 6359364768417988811
  IC_TEMP :  -81.34 | VDDM : 1114.31 | AUX_INT :   -9.28 | CsaBias :   66.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.68544e-03 / 2
  ADC_P0  : -9.28416e-03 ± 2.77788e-02
  ADC_P1  : 8.42855e-03 ± 6.62656e-04
  ADC_P2  : -6.81895e-06 ± 3.13553e-06
  CSA_Chi2/NDF : 1.57829e-04 / 2
  CSA_P0  : 5.49466e-02 ± 8.37945e-03
  CSA_P1  : 9.54911e-03 ± 6.31331e-04
  CSA_P2  : -5.39444e-05 ± 9.61443e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [14]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3641', '1.800', '0.1433', '1.800', '0.1010', '7.000', '0.7085', 1, 1, 1, 1, 1728647751.76385]
VI_after__Init : ['1.202', '0.3652', '1.800', '0.1435', '1.800', '0.0948', '7.000', '0.7076', 1, 1, 1, 1, 1728647759.7992375]
VI_at__the_End : ['1.202', '0.4404', '1.799', '0.1293', '1.800', '0.1268', '7.000', '0.7089', 1, 1, 1, 1, 1728647827.0779202]