TEST_NAME : Wafer
TEST_DATE : 24_10_11-14_07_24
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-004-019-12 | FUSED_ID : 6359364768417988924
  IC_TEMP :  -77.27 | VDDM : 1118.76 | AUX_INT :  -10.03 | CsaBias :   68.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.81754e-03 / 2
  ADC_P0  : -1.00305e-02 ± 2.88621e-02
  ADC_P1  : 8.76821e-03 ± 7.17849e-04
  ADC_P2  : -7.10107e-06 ± 3.55851e-06
  CSA_Chi2/NDF : 1.92889e-04 / 2
  CSA_P0  : 5.73112e-02 ± 9.26352e-03
  CSA_P1  : 1.02186e-02 ± 6.97939e-04
  CSA_P2  : -6.04686e-05 ± 1.06288e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [0, 24, 70]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1909', '1.800', '0.1510', '1.800', '0.0900', '7.000', '0.7074', 1, 1, 1, 1, 1728648444.4476688]
VI_after__Init : ['1.202', '0.1910', '1.800', '0.1512', '1.800', '0.0845', '7.000', '0.7079', 1, 1, 1, 1, 1728648452.549998]
VI_at__the_End : ['1.202', '0.4567', '1.800', '0.1329', '1.800', '0.1236', '7.000', '0.7089', 1, 1, 1, 1, 1728648511.5753732]