TEST_NAME : Wafer
TEST_DATE : 24_10_11-14_48_29
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-005-005-06 | FUSED_ID : 6359364768417992790
  IC_TEMP :  -75.51 | VDDM : 1119.20 | AUX_INT :   -7.98 | CsaBias :   55.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05701e-03 / 2
  ADC_P0  : -7.98065e-03 ± 2.19398e-02
  ADC_P1  : 9.11304e-03 ± 5.66738e-04
  ADC_P2  : -8.27567e-06 ± 2.88394e-06
  CSA_Chi2/NDF : 2.44213e-04 / 2
  CSA_P0  : 5.50974e-02 ± 1.04233e-02
  CSA_P1  : 1.03846e-02 ± 7.85324e-04
  CSA_P2  : -5.89755e-05 ± 1.19596e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [47, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2781', '1.800', '0.1153', '1.800', '0.0887', '7.000', '0.7079', 1, 1, 1, 1, 1728650909.1088252]
VI_after__Init : ['1.202', '0.2784', '1.800', '0.1151', '1.800', '0.0833', '7.000', '0.7083', 1, 1, 1, 1, 1728650917.2862415]
VI_at__the_End : ['1.202', '0.4665', '1.800', '0.1374', '1.800', '0.1224', '7.000', '0.7088', 1, 1, 1, 1, 1728650986.2952933]