TEST_NAME : Wafer
TEST_DATE : 24_10_11-14_45_11
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-005-007-06 | FUSED_ID : 6359364768417992822
  IC_TEMP :  -67.70 | VDDM : 1118.64 | AUX_INT :   -8.69 | CsaBias :   74.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.70615e-03 / 2
  ADC_P0  : -8.69038e-03 ± 2.80490e-02
  ADC_P1  : 8.34267e-03 ± 6.86428e-04
  ADC_P2  : -5.51438e-06 ± 3.34527e-06
  CSA_Chi2/NDF : 2.08329e-04 / 2
  CSA_P0  : 5.57128e-02 ± 9.62713e-03
  CSA_P1  : 9.90713e-03 ± 7.25335e-04
  CSA_P2  : -5.22041e-05 ± 1.10460e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [58]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2593', '1.800', '0.1745', '1.799', '0.0962', '7.000', '0.7079', 1, 1, 1, 1, 1728650711.2899396]
VI_after__Init : ['1.202', '0.2591', '1.800', '0.1738', '1.800', '0.0917', '7.000', '0.7081', 1, 1, 1, 1, 1728650719.558253]
VI_at__the_End : ['1.202', '0.4707', '1.800', '0.1338', '1.800', '0.1191', '7.000', '0.7091', 1, 1, 1, 1, 1728650787.5634634]