TEST_NAME : Wafer
TEST_DATE : 24_10_11-14_43_32
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-005-008-06 | FUSED_ID : 6359364768417992838
  IC_TEMP :  -72.14 | VDDM : 1118.65 | AUX_INT :   -9.69 | CsaBias :   75.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58480e-03 / 2
  ADC_P0  : -9.69496e-03 ± 2.69742e-02
  ADC_P1  : 8.54038e-03 ± 6.62218e-04
  ADC_P2  : -6.49369e-06 ± 3.22915e-06
  CSA_Chi2/NDF : 1.95170e-04 / 2
  CSA_P0  : 5.47668e-02 ± 9.31812e-03
  CSA_P1  : 9.69210e-03 ± 7.02053e-04
  CSA_P2  : -4.98845e-05 ± 1.06914e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1937', '1.800', '0.1378', '1.800', '0.0850', '7.000', '0.7090', 1, 1, 1, 1, 1728650612.7675977]
VI_after__Init : ['1.202', '0.1937', '1.800', '0.1378', '1.800', '0.0789', '7.000', '0.7081', 1, 1, 1, 1, 1728650620.8412004]
VI_at__the_End : ['1.202', '0.4617', '1.800', '0.1338', '1.800', '0.1197', '7.000', '0.7096', 1, 1, 1, 1, 1728650687.59151]