TEST_NAME : Wafer
TEST_DATE : 24_10_11-14_40_14
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-005-010-06 | FUSED_ID : 6359364768417992870
  IC_TEMP :  -75.11 | VDDM : 1118.67 | AUX_INT :   -9.98 | CsaBias :   77.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49608e-03 / 2
  ADC_P0  : -9.97551e-03 ± 2.61742e-02
  ADC_P1  : 8.86380e-03 ± 6.62514e-04
  ADC_P2  : -7.12471e-06 ± 3.33721e-06
  CSA_Chi2/NDF : 1.84815e-04 / 2
  CSA_P0  : 5.58926e-02 ± 9.06756e-03
  CSA_P1  : 9.97421e-03 ± 6.83175e-04
  CSA_P2  : -5.41987e-05 ± 1.04040e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3646', '1.800', '0.1478', '1.800', '0.0365', '7.000', '0.7060', 1, 1, 1, 1, 1728650414.2041812]
VI_after__Init : ['1.202', '0.3650', '1.800', '0.1486', '1.800', '0.0892', '7.000', '0.7082', 1, 1, 1, 1, 1728650422.3295436]
VI_at__the_End : ['1.202', '0.4645', '1.800', '0.1345', '1.800', '0.1229', '7.000', '0.7086', 1, 1, 1, 1, 1728650489.6731155]