TEST_NAME : Wafer
TEST_DATE : 24_10_11-14_37_06
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-005-012-06 | FUSED_ID : 6359364768417992902
  IC_TEMP :  -71.33 | VDDM : 1120.47 | AUX_INT :  -10.23 | CsaBias :   65.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.11238e-03 / 2
  ADC_P0  : -1.02320e-02 ± 3.12193e-02
  ADC_P1  : 8.45581e-03 ± 7.64999e-04
  ADC_P2  : -5.82010e-06 ± 3.74901e-06
  CSA_Chi2/NDF : 1.70537e-04 / 2
  CSA_P0  : 5.67262e-02 ± 8.71027e-03
  CSA_P1  : 1.02908e-02 ± 6.56256e-04
  CSA_P2  : -5.81971e-05 ± 9.99400e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [11, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4595', '1.800', '0.1597', '1.800', '0.1008', '7.000', '0.7090', 1, 1, 1, 1, 1728650225.5580828]
VI_after__Init : ['1.202', '0.4617', '1.800', '0.1607', '1.800', '0.0936', '7.000', '0.7083', 1, 1, 1, 1, 1728650234.430595]
VI_at__the_End : ['1.202', '0.4694', '1.800', '0.1367', '1.800', '0.1212', '7.000', '0.7088', 1, 1, 1, 1, 1728650292.3449872]