TEST_NAME : Wafer
TEST_DATE : 24_10_11-14_25_33
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-005-019-01 | FUSED_ID : 6359364768417993009
  IC_TEMP :  -71.83 | VDDM : 1109.46 | AUX_INT :  -11.00 | CsaBias :   76.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.01321e-03 / 2
  ADC_P0  : -1.10044e-02 ± 3.04131e-02
  ADC_P1  : 8.83010e-03 ± 7.60924e-04
  ADC_P2  : -7.28538e-06 ± 3.78676e-06
  CSA_Chi2/NDF : 2.11596e-04 / 2
  CSA_P0  : 5.64031e-02 ± 9.70233e-03
  CSA_P1  : 1.03692e-02 ± 7.31000e-04
  CSA_P2  : -5.67604e-05 ± 1.11323e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2475', '1.800', '0.1658', '1.800', '0.0911', '7.000', '0.7078', 1, 1, 1, 1, 1728649533.1866362]
VI_after__Init : ['1.202', '0.2474', '1.800', '0.1659', '1.800', '0.0858', '7.000', '0.7076', 1, 1, 1, 1, 1728649541.3140266]
VI_at__the_End : ['1.202', '0.4767', '1.800', '0.1366', '1.800', '0.1182', '7.000', '0.7086', 1, 1, 1, 1, 1728649609.4056542]