TEST_NAME : Wafer
TEST_DATE : 24_10_11-14_53_26
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-006-004-08 | FUSED_ID : 6359364768417996872
  IC_TEMP :  -73.40 | VDDM : 1118.29 | AUX_INT :   -7.82 | CsaBias :   77.52
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33364e-03 / 2
  ADC_P0  : -7.81636e-03 ± 2.47345e-02
  ADC_P1  : 8.59783e-03 ± 6.17825e-04
  ADC_P2  : -6.37588e-06 ± 3.06036e-06
  CSA_Chi2/NDF : 2.27882e-04 / 2
  CSA_P0  : 5.66701e-02 ± 1.00688e-02
  CSA_P1  : 1.06573e-02 ± 7.58610e-04
  CSA_P2  : -6.08969e-05 ± 1.15527e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3349', '1.800', '0.1649', '1.800', '0.0987', '7.000', '0.7081', 1, 1, 1, 1, 1728651206.099184]
VI_after__Init : ['1.202', '0.3358', '1.800', '0.1655', '1.800', '0.0936', '7.000', '0.7080', 1, 1, 1, 1, 1728651214.2825706]
VI_at__the_End : ['1.202', '0.4789', '1.800', '0.1373', '1.800', '0.1202', '7.000', '0.7091', 1, 1, 1, 1, 1728651284.1324518]