TEST_NAME : Wafer
TEST_DATE : 24_10_11-14_55_05
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-006-005-08 | FUSED_ID : 6359364768417996888
  IC_TEMP :  -64.90 | VDDM : 1100.38 | AUX_INT :   -7.30 | CsaBias :   82.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34608e-03 / 2
  ADC_P0  : -7.29891e-03 ± 2.49141e-02
  ADC_P1  : 8.21739e-03 ± 6.10889e-04
  ADC_P2  : -4.95315e-06 ± 2.97713e-06
  CSA_Chi2/NDF : 2.15321e-04 / 2
  CSA_P0  : 5.45914e-02 ± 9.78736e-03
  CSA_P1  : 1.05933e-02 ± 7.37407e-04
  CSA_P2  : -5.94447e-05 ± 1.12298e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [7, 18, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [7, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3554', '1.800', '0.1355', '1.800', '0.0933', '7.000', '0.7079', 1, 1, 1, 1, 1728651305.0519006]
VI_after__Init : ['1.202', '0.3554', '1.800', '0.1354', '1.800', '0.0880', '7.000', '0.7083', 1, 1, 1, 1, 1728651313.3252938]
VI_at__the_End : ['1.202', '0.4808', '1.800', '0.1349', '1.800', '0.1198', '7.000', '0.7088', 1, 1, 1, 1, 1728651381.000311]