TEST_NAME : Wafer
TEST_DATE : 24_10_11-15_59_23
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-007-009-05 | FUSED_ID : 6359364768418001045
  IC_TEMP :  -67.66 | VDDM : 1128.34 | AUX_INT :   -6.71 | CsaBias :   70.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.61037e-04 / 2
  ADC_P0  : -6.70945e-03 ± 1.98439e-02
  ADC_P1  : 8.61995e-03 ± 5.01031e-04
  ADC_P2  : -6.42341e-06 ± 2.49536e-06
  CSA_Chi2/NDF : 1.56675e-04 / 2
  CSA_P0  : 5.90637e-02 ± 8.34877e-03
  CSA_P1  : 9.97088e-03 ± 6.29020e-04
  CSA_P2  : -5.11039e-05 ± 9.57923e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [3]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [21]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3720', '1.800', '0.1610', '1.800', '0.0986', '7.000', '0.7084', 1, 1, 1, 1, 1728655162.8917646]
VI_after__Init : ['1.202', '0.3726', '1.800', '0.1614', '1.801', '0.0916', '7.000', '0.7077', 1, 1, 1, 1, 1728655171.0071332]
VI_at__the_End : ['1.202', '0.4794', '1.800', '0.1380', '1.807', '0.1188', '7.000', '0.7085', 1, 1, 1, 1, 1728655233.9612129]