TEST_NAME : Wafer
TEST_DATE : 24_10_11-15_56_05
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-007-011-05 | FUSED_ID : 6359364768418001077
  IC_TEMP :  -61.83 | VDDM : 1094.58 | AUX_INT :   -7.67 | CsaBias :   69.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36069e-03 / 2
  ADC_P0  : -7.66570e-03 ± 2.49763e-02
  ADC_P1  : 8.61124e-03 ± 6.21854e-04
  ADC_P2  : -6.64395e-06 ± 3.06292e-06
  CSA_Chi2/NDF : 1.63163e-04 / 2
  CSA_P0  : 5.73377e-02 ± 8.51988e-03
  CSA_P1  : 9.91453e-03 ± 6.41911e-04
  CSA_P2  : -4.90002e-05 ± 9.77555e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [24]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4619', '1.799', '0.1606', '1.800', '0.1060', '7.000', '0.7073', 1, 1, 1, 1, 1728654965.656173]
VI_after__Init : ['1.202', '0.4628', '1.800', '0.1608', '1.800', '0.1007', '7.000', '0.7076', 1, 1, 1, 1, 1728654973.6655977]
VI_at__the_End : ['1.202', '0.4830', '1.799', '0.1367', '1.800', '0.1167', '7.000', '0.7084', 1, 1, 1, 1, 1728655037.6255093]