TEST_NAME : Wafer
TEST_DATE : 24_10_11-15_54_26
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-007-012-05 | FUSED_ID : 6359364768418001093
  IC_TEMP :  -66.82 | VDDM : 1133.61 | AUX_INT :   -7.50 | CsaBias :   76.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04639e-03 / 2
  ADC_P0  : -7.50407e-03 ± 2.19094e-02
  ADC_P1  : 8.47787e-03 ± 5.48353e-04
  ADC_P2  : -5.80293e-06 ± 2.71631e-06
  CSA_Chi2/NDF : 1.57013e-04 / 2
  CSA_P0  : 5.90146e-02 ± 8.35776e-03
  CSA_P1  : 1.01221e-02 ± 6.29697e-04
  CSA_P2  : -5.31158e-05 ± 9.58954e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [14]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [6, 8, 16, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2110', '1.799', '0.1537', '1.800', '0.0881', '7.000', '0.7083', 1, 1, 1, 1, 1728654866.302982]
VI_after__Init : ['1.202', '0.2110', '1.799', '0.1537', '1.800', '0.0812', '7.000', '0.7075', 1, 1, 1, 1, 1728654874.3553698]
VI_at__the_End : ['1.202', '0.4811', '1.799', '0.1349', '1.800', '0.1189', '7.000', '0.7083', 1, 1, 1, 1, 1728654938.617368]