TEST_NAME : Wafer
TEST_DATE : 24_10_11-15_49_30
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-007-015-05 | FUSED_ID : 6359364768418001141
  IC_TEMP :  -73.55 | VDDM : 1118.70 | AUX_INT :  -11.16 | CsaBias :   67.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.85920e-03 / 2
  ADC_P0  : -1.11596e-02 ± 2.91910e-02
  ADC_P1  : 8.77917e-03 ± 7.26031e-04
  ADC_P2  : -7.12586e-06 ± 3.59907e-06
  CSA_Chi2/NDF : 1.79104e-04 / 2
  CSA_P0  : 5.79534e-02 ± 8.92638e-03
  CSA_P1  : 1.02645e-02 ± 6.72538e-04
  CSA_P2  : -5.86823e-05 ± 1.02420e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [40, 44, 50, 104, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4085', '1.800', '0.1525', '1.800', '0.0975', '7.000', '0.7080', 1, 1, 1, 1, 1728654570.4115949]
VI_after__Init : ['1.202', '0.4097', '1.800', '0.1526', '1.800', '0.0906', '7.000', '0.7073', 1, 1, 1, 1, 1728654578.507004]
VI_at__the_End : ['1.202', '0.4672', '1.800', '0.1376', '1.800', '0.1199', '7.000', '0.7078', 1, 1, 1, 1, 1728654639.3380427]