TEST_NAME : Wafer
TEST_DATE : 24_10_11-15_42_55
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-007-019-02 | FUSED_ID : 6359364768418001202
  IC_TEMP :  -67.13 | VDDM : 1118.37 | AUX_INT :   -9.58 | CsaBias :   74.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.88552e-03 / 2
  ADC_P0  : -9.58390e-03 ± 2.94340e-02
  ADC_P1  : 8.44514e-03 ± 7.10445e-04
  ADC_P2  : -6.45853e-06 ± 3.41114e-06
  CSA_Chi2/NDF : 1.50608e-04 / 2
  CSA_P0  : 5.85747e-02 ± 8.18551e-03
  CSA_P1  : 9.91642e-03 ± 6.16719e-04
  CSA_P2  : -5.10241e-05 ± 9.39191e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [21, 29]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [4, 52, 58, 65]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2884', '1.800', '0.1479', '1.800', '0.0929', '7.000', '0.7072', 1, 1, 1, 1, 1728654174.5012255]
VI_after__Init : ['1.202', '0.2883', '1.800', '0.1481', '1.800', '0.0873', '7.000', '0.7072', 1, 1, 1, 1, 1728654183.387527]
VI_at__the_End : ['1.202', '0.4756', '1.800', '0.1364', '1.800', '0.1184', '7.000', '0.7079', 1, 1, 1, 1, 1728654249.0096135]