TEST_NAME : Wafer
TEST_DATE : 24_10_11-16_34_00
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-008-016-06 | FUSED_ID : 6359364768418005254
  IC_TEMP :  -65.16 | VDDM : 1120.87 | AUX_INT :   -8.68 | CsaBias :   68.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39445e-03 / 2
  ADC_P0  : -8.68476e-03 ± 2.52842e-02
  ADC_P1  : 8.61690e-03 ± 6.29520e-04
  ADC_P2  : -6.65410e-06 ± 3.10068e-06
  CSA_Chi2/NDF : 1.50276e-04 / 2
  CSA_P0  : 5.95152e-02 ± 8.17649e-03
  CSA_P1  : 9.87985e-03 ± 6.16040e-04
  CSA_P2  : -4.93939e-05 ± 9.38156e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3786', '1.800', '0.1655', '1.800', '0.0974', '7.000', '0.7075', 1, 1, 1, 1, 1728657240.7892978]
VI_after__Init : ['1.201', '0.3789', '1.800', '0.1655', '1.800', '0.0925', '7.000', '0.7074', 1, 1, 1, 1, 1728657248.775669]
VI_at__the_End : ['1.201', '0.4826', '1.800', '0.1386', '1.800', '0.1173', '7.000', '0.7082', 1, 1, 1, 1, 1728657307.8283892]