TEST_NAME : Wafer
TEST_DATE : 24_10_11-16_35_39
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-008-017-06 | FUSED_ID : 6359364768418005270
  IC_TEMP :  -64.38 | VDDM : 1124.35 | AUX_INT :   -7.82 | CsaBias :   62.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01481e-03 / 2
  ADC_P0  : -7.82294e-03 ± 2.15155e-02
  ADC_P1  : 8.86892e-03 ± 5.48783e-04
  ADC_P2  : -7.31625e-06 ± 2.76386e-06
  CSA_Chi2/NDF : 1.65163e-04 / 2
  CSA_P0  : 5.93723e-02 ± 8.57194e-03
  CSA_P1  : 1.03800e-02 ± 6.45834e-04
  CSA_P2  : -5.53540e-05 ± 9.83529e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [80, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3545', '1.800', '0.1476', '1.800', '0.0936', '7.000', '0.7082', 1, 1, 1, 1, 1728657339.178004]
VI_after__Init : ['1.202', '0.3547', '1.800', '0.1476', '1.800', '0.0865', '7.000', '0.7077', 1, 1, 1, 1, 1728657347.3294187]
VI_at__the_End : ['1.201', '0.4863', '1.800', '0.1406', '1.800', '0.1158', '7.000', '0.7080', 1, 1, 1, 1, 1728657406.0061007]