TEST_NAME : Wafer
TEST_DATE : 24_10_11-16_38_56
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-008-019-06 | FUSED_ID : 6359364768418005302
  IC_TEMP :  -57.97 | VDDM : 1124.34 | AUX_INT :  -10.38 | CsaBias :   81.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.66174e-03 / 2
  ADC_P0  : -1.03763e-02 ± 2.75912e-02
  ADC_P1  : 8.43482e-03 ± 6.60171e-04
  ADC_P2  : -6.65623e-06 ± 3.14074e-06
  CSA_Chi2/NDF : 1.15775e-04 / 2
  CSA_P0  : 5.71000e-02 ± 7.17679e-03
  CSA_P1  : 9.71386e-03 ± 5.40719e-04
  CSA_P2  : -4.54791e-05 ± 8.23451e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [41, 97, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3795', '1.800', '0.1475', '1.800', '0.0874', '7.000', '0.7071', 1, 1, 1, 1, 1728657536.459466]
VI_after__Init : ['1.201', '0.3798', '1.800', '0.1475', '1.800', '0.0828', '7.000', '0.7075', 1, 1, 1, 1, 1728657544.583834]
VI_at__the_End : ['1.202', '0.4849', '1.800', '0.1366', '1.800', '0.1134', '7.000', '0.7081', 1, 1, 1, 1, 1728657611.7188208]