TEST_NAME : Wafer
TEST_DATE : 24_10_11-17_31_43
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-009-004-12 | FUSED_ID : 6359364768418009164
  IC_TEMP :  -71.01 | VDDM : 1116.21 | AUX_INT :   -9.18 | CsaBias :   50.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.60689e-03 / 2
  ADC_P0  : -9.18290e-03 ± 2.71740e-02
  ADC_P1  : 8.50051e-03 ± 6.68593e-04
  ADC_P2  : -6.35934e-06 ± 3.25729e-06
  CSA_Chi2/NDF : 1.76254e-04 / 2
  CSA_P0  : 5.79971e-02 ± 8.85507e-03
  CSA_P1  : 9.81243e-03 ± 6.67165e-04
  CSA_P2  : -5.05179e-05 ± 1.01601e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [32, 52, 65]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1592', '1.800', '0.1866', '1.800', '0.0917', '7.000', '0.7072', 1, 1, 1, 1, 1728660703.108452]
VI_after__Init : ['1.201', '0.1593', '1.800', '0.1867', '1.800', '0.0869', '7.000', '0.7069', 1, 1, 1, 1, 1728660711.2707732]
VI_at__the_End : ['1.202', '0.4701', '1.800', '0.1389', '1.800', '0.1195', '7.000', '0.7078', 1, 1, 1, 1, 1728660776.7990172]