TEST_NAME : Wafer
TEST_DATE : 24_10_11-17_26_46
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-009-007-12 | FUSED_ID : 6359364768418009212
  IC_TEMP :  -67.12 | VDDM : 1123.33 | AUX_INT :   -9.30 | CsaBias :   73.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58023e-03 / 2
  ADC_P0  : -9.29995e-03 ± 2.69380e-02
  ADC_P1  : 8.35011e-03 ± 6.49377e-04
  ADC_P2  : -6.19163e-06 ± 3.10105e-06
  CSA_Chi2/NDF : 1.62410e-04 / 2
  CSA_P0  : 5.99822e-02 ± 8.50020e-03
  CSA_P1  : 9.92060e-03 ± 6.40429e-04
  CSA_P2  : -4.96872e-05 ± 9.75297e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [46, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [26, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1887', '1.800', '0.1412', '1.800', '0.0915', '7.000', '0.7080', 1, 1, 1, 1, 1728660406.095045]
VI_after__Init : ['1.202', '0.1887', '1.800', '0.1412', '1.800', '0.0843', '7.000', '0.7071', 1, 1, 1, 1, 1728660415.0194333]
VI_at__the_End : ['1.201', '0.4815', '1.800', '0.1376', '1.800', '0.1188', '7.000', '0.7079', 1, 1, 1, 1, 1728660475.482849]