TEST_NAME : Wafer
TEST_DATE : 24_10_11-17_16_52
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-009-013-12 | FUSED_ID : 6359364768418009308
  IC_TEMP :  -68.46 | VDDM : 1125.74 | AUX_INT :   -9.10 | CsaBias :   59.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.59037e-03 / 2
  ADC_P0  : -9.09628e-03 ± 2.70522e-02
  ADC_P1  : 8.63655e-03 ± 6.81849e-04
  ADC_P2  : -6.23537e-06 ± 3.40980e-06
  CSA_Chi2/NDF : 1.85399e-04 / 2
  CSA_P0  : 6.03282e-02 ± 9.08188e-03
  CSA_P1  : 1.04094e-02 ± 6.84254e-04
  CSA_P2  : -5.78097e-05 ± 1.04204e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [71, 73]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [44, 48, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3196', '1.800', '0.1422', '1.800', '0.0950', '7.000', '0.7080', 1, 1, 1, 1, 1728659812.3482754]
VI_after__Init : ['1.201', '0.3201', '1.800', '0.1422', '1.800', '0.0879', '7.000', '0.7070', 1, 1, 1, 1, 1728659820.3885717]
VI_at__the_End : ['1.202', '0.4820', '1.800', '0.1401', '1.800', '0.1191', '7.000', '0.7078', 1, 1, 1, 1, 1728659882.772803]